Invention Grant
US08193718B2 Diagnosis circuit apparatus and lamp ballast circuit using the same
失效
诊断电路设备和灯镇流器电路使用相同
- Patent Title: Diagnosis circuit apparatus and lamp ballast circuit using the same
- Patent Title (中): 诊断电路设备和灯镇流器电路使用相同
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Application No.: US12217375Application Date: 2008-07-03
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Publication No.: US08193718B2Publication Date: 2012-06-05
- Inventor: Gye-Hyun Cho , Young-Sik Lee
- Applicant: Gye-Hyun Cho , Young-Sik Lee
- Applicant Address: KR Bucheon
- Assignee: Fairchild Korea Semiconductor, Ltd.
- Current Assignee: Fairchild Korea Semiconductor, Ltd.
- Current Assignee Address: KR Bucheon
- Agency: Sidley Austin LLP
- Priority: KR10-2007-0066979 20070704
- Main IPC: H05B37/02
- IPC: H05B37/02

Abstract:
The present invention relates to a diagnostic device and a lamp ballast circuit. The lamp ballast circuit includes a first power switch, a second power switch, a lamp driven according to switching operations of the first and second power switches, a controller for controlling the switching operations of the first and second power switches, and a diagnostic device. The diagnostic device senses a voltage waveform applied to the lamp to determine an end of lamp life (EOLL) condition and an over-voltage, senses a filament voltage of the lamp to determine a filament connection state of the lamp, and determines an over-voltage of a voltage applied to the controller.
Public/Granted literature
- US20090021177A1 Diagnosis circuit apparatus and lamp ballast circuit using the same Public/Granted day:2009-01-22
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