Invention Grant
- Patent Title: System and method for determining capacitance value
- Patent Title (中): 用于确定电容值的系统和方法
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Application No.: US12494417Application Date: 2009-06-30
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Publication No.: US08193822B2Publication Date: 2012-06-05
- Inventor: David Welland
- Applicant: David Welland
- Applicant Address: US TX Austin
- Assignee: Silicon Laboratories Inc.
- Current Assignee: Silicon Laboratories Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A circuit for determining a value of a variable capacitor includes first circuitry for generating a first indication when a variable voltage across the variable capacitor exceeds a threshold voltage. Second circuitry generates a second indication when a reference voltage across a reference capacitor exceeds the threshold voltage. Control logic responsive to the first and second indications generate a control signal indicating whether the first indication or the second indication occurs first. A successive approximation engine generates an N-bit control value responsive to the control signal. A variable current source is responsive to the N-bit control value for generating a variable current to the first circuitry. A reference current source generates a reference current to the second circuitry.
Public/Granted literature
- US20100201382A1 SYSTEM AND METHOD FOR DETERMINING CAPACITANCE VALUE Public/Granted day:2010-08-12
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