发明授权
US08193851B2 Fuse circuit of semiconductor device and method for monitoring fuse state thereof
失效
半导体装置的保险丝电路及其熔断状态的监视方法
- 专利标题： Fuse circuit of semiconductor device and method for monitoring fuse state thereof
- 专利标题（中）： 半导体装置的保险丝电路及其熔断状态的监视方法
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申请号： US12494520申请日： 2009-06-30
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公开(公告)号： US08193851B2公开(公告)日： 2012-06-05
- 发明人: Seung-Lo Kim
- 申请人： Seung-Lo Kim
- 申请人地址： KR Gyeonggi-do
- 专利权人： Hynix Semiconductor Inc.
- 当前专利权人： Hynix Semiconductor Inc.
- 当前专利权人地址： KR Gyeonggi-do
- 代理机构： IP & T Group LLP
- 优先权： KR10-2009-0043554 20090519
- 主分类号： H01H37/76
- IPC分类号： H01H37/76 ; H01H85/00
摘要：
A fuse circuit of a semiconductor device includes a plurality of fuse set units configured to compare an input address with address information programmed according to a fuse cutting state and a test control unit configured to enable one or more fuse set units selected based on a number of times that a selection signal is enabled in a test mode.
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