Invention Grant
- Patent Title: Variable resistance memory device and system
- Patent Title (中): 可变电阻存储器件和系统
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Application No.: US12693005Application Date: 2010-01-25
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Publication No.: US08194492B2Publication Date: 2012-06-05
- Inventor: Qi Wang , Kwang-Jin Lee , Woo-Yeong Cho , Taek-Sung Kim , Kwang-Ho Kim , Hyun-Ho Choi , Yong-Jun Lee , Hye-Jin Kim
- Applicant: Qi Wang , Kwang-Jin Lee , Woo-Yeong Cho , Taek-Sung Kim , Kwang-Ho Kim , Hyun-Ho Choi , Yong-Jun Lee , Hye-Jin Kim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2008-0032768 20080408
- Main IPC: G11C8/00
- IPC: G11C8/00

Abstract:
Disclosed is a semiconductor memory device including a memory cell array having a plurality of variable resistance memory cells divided into first and second areas. An I/O circuit is configured to access the memory cell array under the control of control logic so as to access the first or second area in response to an external command. The I/O circuit accesses the first area using a memory cell unit and the second area using a page unit.
Public/Granted literature
- US20100124105A1 VARIABLE RESISTANCE MEMORY DEVICE AND SYSTEM Public/Granted day:2010-05-20
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