Invention Grant
US08200006B2 Image processing apparatus for analysis of pattern matching failure
有权
用于分析图案匹配故障的图像处理装置
- Patent Title: Image processing apparatus for analysis of pattern matching failure
- Patent Title (中): 用于分析图案匹配故障的图像处理装置
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Application No.: US12434786Application Date: 2009-05-04
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Publication No.: US08200006B2Publication Date: 2012-06-12
- Inventor: Mitsuji Ikeda , Tatsuya Maeda , Osamu Nasu , Fumihiro Sasajima
- Applicant: Mitsuji Ikeda , Tatsuya Maeda , Osamu Nasu , Fumihiro Sasajima
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2005-229800 20050808
- Main IPC: G09K9/00
- IPC: G09K9/00
Abstract:
Information indicating the reason for a failure of template matching is provided. Difference information between a first image, which is referred to as a template, and a third image that is selected by the operator from a second image and that is larger than the template is displayed.
Public/Granted literature
- US20090214122A1 Image processing apparatus for analysis of pattern matching failure Public/Granted day:2009-08-27
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