发明授权
- 专利标题： IC with test and shadow access ports and output circuit
- 专利标题（中）： IC具有测试和影子访问端口和输出电路
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申请号： US13183113申请日： 2011-07-14
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公开(公告)号： US08201036B2公开(公告)日： 2012-06-12
- 发明人: Lee D. Whetsel
- 申请人： Lee D. Whetsel
- 申请人地址： US TX Dallas
- 专利权人： Texas Instruments Incorporated
- 当前专利权人： Texas Instruments Incorporated
- 当前专利权人地址： US TX Dallas
- 代理商 Lawrence J. Bassuk; W. James Brady; Frederick J. Telecky, Jr.
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
The disclosure describes a novel method and apparatus for providing a shadow access port within a device. The shadow access port is accessed to perform operations in the device by reusing the TDI, TMS, TCK and TDO signals that are used to operate a test access port within the device. The presence and operation of the shadow access port is transparent to the presence and operation of the test access port. According to the disclosure, the shadow access port operates on the falling edge of the TCK signal while the test access port conventionally operates on the rising edge of the TCK signal.
公开/授权文献
- US20110276847A1 SHADOW ACCESS PORT METHOD AND APPARATUS 公开/授权日：2011-11-10
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