发明授权
- 专利标题: Image forming method and charged particle beam apparatus
- 专利标题(中): 成像方法和带电粒子束装置
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申请号: US12907912申请日: 2010-10-19
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公开(公告)号: US08203504B2公开(公告)日: 2012-06-19
- 发明人: Atsushi Kobaru , Hidetoshi Morokuma , Hiroki Kawada , Sho Takami , Katsuhiro Sasada , Kouichi Yamamoto , Norio Satou , Kunio Nakanishi
- 申请人: Atsushi Kobaru , Hidetoshi Morokuma , Hiroki Kawada , Sho Takami , Katsuhiro Sasada , Kouichi Yamamoto , Norio Satou , Kunio Nakanishi
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 优先权: JP2005-221185 20050729; JP2005-338009 20051124
- 主分类号: G09G1/08
- IPC分类号: G09G1/08
摘要:
An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.
公开/授权文献
- US20110032176A1 IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM APPARATUS 公开/授权日:2011-02-10
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