A system includes a dual in-line memory module and a system board. The dual in-line memory module includes a plurality of dynamic random access memory devices, and a system management interface. The system management interface is configured to measure a first voltage provided to the dynamic random access memory devices, and configured to digitize the first voltage. The system board includes a test module and a voltage regulator. The test module is configured to receive the digitized first voltage via a connector pin between the dual in-line memory module and the system board, and configured to compare the first voltage to a first threshold voltage. The voltage regulator is configured to adjust a remote sense target voltage for the system management interface when the first voltage is less than the first threshold voltage.