发明授权
- 专利标题： Bad pixel cluster detection
- 专利标题（中）： 坏像素群检测
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申请号： US12233413申请日： 2008-09-18
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公开(公告)号： US08208044B2公开(公告)日： 2012-06-26
- 发明人: Kalin Atanassov , Hsiang-Tsun Li , Hau Hwang , Babak Forutanpour
- 申请人： Kalin Atanassov , Hsiang-Tsun Li , Hau Hwang , Babak Forutanpour
- 申请人地址： US CA San Diego
- 专利权人： QUALCOMM Incorporated
- 当前专利权人： QUALCOMM Incorporated
- 当前专利权人地址： US CA San Diego
- 代理商 Matthew J. Evans; James R. Gambale, Jr.
- 主分类号： H04N5/217
- IPC分类号： H04N5/217
摘要：
Systems and methods of bad pixel cluster detection are disclosed. In a particular embodiment, a method includes determining a correlation value corresponding to a correlation coefficient between image data and at least one bad pixel cluster pattern, and detecting a bad pixel cluster corresponding to the at least one bad pixel cluster pattern based on the correlation value exceeding a threshold.
公开/授权文献
- US20100066871A1 BAD PIXEL CLUSTER DETECTION 公开/授权日：2010-03-18
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