发明授权
- 专利标题: Exposure method, substrate stage, exposure apparatus, and device manufacturing method
- 专利标题(中): 曝光方法,基材台,曝光装置和装置制造方法
-
申请号: US12232063申请日: 2008-09-10
-
公开(公告)号: US08208117B2公开(公告)日: 2012-06-26
- 发明人: Soichi Owa , Nobutaka Magome , Shigeru Hirukawa , Yoshihiko Kudo , Jiro Inoue , Hirotaka Kohno , Masahiro Nei , Motokatsu Imai , Hiroyuki Nagasaka , Kenichi Shiraishi , Yasufumi Nishii , Hiroaki Takaiwa
- 申请人: Soichi Owa , Nobutaka Magome , Shigeru Hirukawa , Yoshihiko Kudo , Jiro Inoue , Hirotaka Kohno , Masahiro Nei , Motokatsu Imai , Hiroyuki Nagasaka , Kenichi Shiraishi , Yasufumi Nishii , Hiroaki Takaiwa
- 申请人地址: JP Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff & Berridge, PLC
- 优先权: JP2003-169904 20030613; JP2003-383887 20031113; JP2004-039654 20040217
- 主分类号: G03B27/52
- IPC分类号: G03B27/52 ; G03B27/42 ; G03B27/58 ; G03B27/54 ; G03B27/60
摘要:
An exposure apparatus exposes a substrate by projecting a pattern image onto the substrate through a liquid. The exposure apparatus includes a projection optical system by which the pattern image is projected onto the substrate, and a movable member which is movable relative to the projection optical system. A liquid-repellent member, at least a part of a surface of which is liquid-repellent, is provided detachably on the movable member, the liquid-repellent member being different from the substrate.
公开/授权文献
信息查询