Invention Grant
US08208144B2 Spatial frequency optical measurement instrument and method 有权
空间光学测量仪器及方法

  • Patent Title: Spatial frequency optical measurement instrument and method
  • Patent Title (中): 空间光学测量仪器及方法
  • Application No.: US12668926
    Application Date: 2008-07-15
  • Publication No.: US08208144B2
    Publication Date: 2012-06-26
  • Inventor: Perry A. Palumbo
  • Applicant: Perry A. Palumbo
  • Applicant Address: US CO Loveland
  • Assignee: Hach Company
  • Current Assignee: Hach Company
  • Current Assignee Address: US CO Loveland
  • Agency: Ference & Associates LLC
  • International Application: PCT/US2008/070055 WO 20080715
  • International Announcement: WO2009/012255 WO 20090122
  • Main IPC: G01N21/59
  • IPC: G01N21/59 G01N21/55
Spatial frequency optical measurement instrument and method
Abstract:
A spatial frequency optical measurement instrument (100) is provided according to the invention. The instrument (100) includes a spatial frequency mask (120) positioned in a light path and configured to encode light with spatial frequency information, a light receiver (140) positioned to receive the light encoded with the spatial frequency information, wherein the light encoded with the spatial frequency information has been interacted with a sample material, and a processing system (180) coupled to the light receiver (140) and configured to determine a change in the spatial frequency information due to the interaction of the light with the sample material.
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