发明授权
- 专利标题: Nonvolatile memory devices having common bit line structure
- 专利标题(中): 具有公共位线结构的非易失性存储器件
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申请号: US12573239申请日: 2009-10-05
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公开(公告)号: US08208301B2公开(公告)日: 2012-06-26
- 发明人: Hee-soo Kang , Choong-ho Lee , Yoon-moon Park , Dong-hoon Jang , Young-bae Yoon
- 申请人: Hee-soo Kang , Choong-ho Lee , Yoon-moon Park , Dong-hoon Jang , Young-bae Yoon
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel Sibley & Sajovec
- 优先权: KR10-2008-0098780 20081008
- 主分类号: G11C16/04
- IPC分类号: G11C16/04
摘要:
Provided is a nonvolatile memory device having a common bit line structure. The nonvolatile memory device includes multiple unit elements having a NAND cell array structure, arranged in each of multiple memory strings, and each including a control gate and a charge storage layer. Multiple common bit lines are each commonly connected to ends of each of one pair of memory strings among the memory strings. Provided are a first selection transistor having a first driving voltage and multiple second selection transistors connected in series to the first selection transistors and having a second driving voltage that is lower than the first driving voltage. The first selection transistor and the second selection transistors are arranged between the common bit lines and the unit elements of the of memory strings.
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