发明授权
- 专利标题： Method for testing wireless connection of electronic device
- 专利标题（中）： 电子设备无线连接测试方法
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申请号： US12551730申请日： 2009-09-01
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公开(公告)号： US08208400B2公开(公告)日： 2012-06-26
- 发明人: Wen-Yi Wu , Xiao-Fei Liu , Wen Deng
- 申请人： Wen-Yi Wu , Xiao-Fei Liu , Wen Deng
- 申请人地址： CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- 专利权人： Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人： Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址： CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- 代理机构： Altis Law Group, Inc.
- 优先权： CN200910302852 20090602
- 主分类号： G01R31/08
- IPC分类号： G01R31/08
摘要：
A method for testing a wireless connection of an electronic device includes the following steps. The electronic device is initialized to a stand-by state. A testing server connects the electronic device to form a wireless connection based on a wireless protocol. The testing server outputs a plurality of first data packages to the electronic device and receives a plurality of second data packages from the electronic device to test a rate of data throughput via the wireless connection by the testing server. A wake-up signal is sent to the electronic device via the wireless connection to the electronic device.
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