发明授权
US08214166B2 Method and its system for calibrating measured data between different measuring tools
有权
用于校准不同测量工具之间测量数据的方法及其系统
- 专利标题: Method and its system for calibrating measured data between different measuring tools
- 专利标题(中): 用于校准不同测量工具之间测量数据的方法及其系统
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申请号: US12137779申请日: 2008-06-12
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公开(公告)号: US08214166B2公开(公告)日: 2012-07-03
- 发明人: Maki Tanaka , Wataru Nagatomo
- 申请人: Maki Tanaka , Wataru Nagatomo
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 优先权: JP2007-158621 20070615
- 主分类号: G01P21/00
- IPC分类号: G01P21/00
摘要:
A method, and a corresponding system, are provided for calibrating data of an object measured by different measuring tools, including measuring a Critical-Dimension (CD) and roughness of an object by using a CD-SEM tool, calculating a number of cross section measurement points required for calibration, by statistically processing the roughness of the object, measuring the cross section of the object by using a cross section measuring tool to obtain cross section data at the calculated number of cross section measurement points, calculating the average measurement of the cross section measurement height, and calculating a calibration correction value that is a function of a difference between the average CD measurement of the object and the average measurement of the cross section measurement height of the object.
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