发明授权
- 专利标题： Apparatus and method for improving the measurement accuracy of digital 3D geometrical measurement systems
- 专利标题（中）： 用于提高数字3D几何测量系统测量精度的装置和方法
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申请号： US12519098申请日： 2007-12-12
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公开(公告)号： US08218153B2公开(公告)日： 2012-07-10
- 发明人: Guenther Kostka , Peter Schmitt
- 申请人： Guenther Kostka , Peter Schmitt
- 申请人地址： DE Munich
- 专利权人： Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- 当前专利权人： Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- 当前专利权人地址： DE Munich
- 代理机构： Glenn Patent Group
- 代理商 Michael A. Glenn
- 优先权： DE102006059416 20061215
- 国际申请： PCT/EP2007/010900 WO 20071212
- 国际公布： WO2008/071414 WO 20080619
- 主分类号： G01B11/24
- IPC分类号： G01B11/24
摘要：
The resolution of an optical measurement system for measuring a surface of an object, wherein a measurement light strip is captured on a surface of an object by means of a matrix sensor with a resolution limited by quantization in a quantization direction, can be improved by calculating an effective mapping location in the quantization direction on the basis of the associated real mapping location and a further real mapping location adjacent to the associated real mapping location in a direction perpendicular to the quantization direction.
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