Invention Grant
- Patent Title: Generating a process and temperature tracking bias voltage
- Patent Title (中): 产生过程和温度跟踪偏置电压
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Application No.: US12578838Application Date: 2009-10-14
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Publication No.: US08219049B2Publication Date: 2012-07-10
- Inventor: Anil Samavedam , David E. Bockelman , Vishnu Srinivasan
- Applicant: Anil Samavedam , David E. Bockelman , Vishnu Srinivasan
- Applicant Address: US TX Austin
- Assignee: Javelin Semiconductor, Inc.
- Current Assignee: Javelin Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agency: Trop, Pruner & Hu, P.C.
- Main IPC: H04B1/04
- IPC: H04B1/04 ; H03G3/20
Abstract:
In one embodiment, a method includes generating a current that is proportional to a mobility and an oxide capacitance of a tracking device and independent of a threshold voltage variation of the tracking device, generating a voltage from the current, and providing the voltage as at least part of a bias voltage for another device. In one embodiment, this other device may be a compensation circuit coupled to a main device to compensate for capacitance non-linearity of the main device.
Public/Granted literature
- US20100085119A1 Generating A Process And Temperature Tracking Bias Voltage Public/Granted day:2010-04-08
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