发明授权
- 专利标题: Gas analyzer and method of gas analysis
- 专利标题(中): 气体分析仪和气体分析方法
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申请号: US12312307申请日: 2007-05-24
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公开(公告)号: US08220310B2公开(公告)日: 2012-07-17
- 发明人: Kazushi Yamanaka , Toshihiro Tsuji , Naoya Iwata
- 申请人: Kazushi Yamanaka , Toshihiro Tsuji , Naoya Iwata
- 申请人地址: JP Sendai-shi
- 专利权人: Tohoku University
- 当前专利权人: Tohoku University
- 当前专利权人地址: JP Sendai-shi
- 代理机构: Oliff & Berridge, PLC
- 优先权: JP2006-304650 20061110
- 国际申请: PCT/JP2007/060599 WO 20070524
- 国际公布: WO2008/056458 WO 20080515
- 主分类号: G01N30/02
- IPC分类号: G01N30/02
摘要:
A gas analyzer that can be miniaturized and detect a wide variety of gases with high sensitivity, and a method of gas analysis. A separation column is configured so as to pass a sample gas together with a carrier gas through the inside thereof. A surface acoustic wave device has a base material with an annularly continuous annular surface formed of at least a part of a spherical surface; a surface acoustic wave generating means capable of generating a surface acoustic wave that propagates along the annular surface; and a plurality of reaction parts provided along the annular surface so as to change a predetermined physical quantity of the surface acoustic wave in response to the components of the sample gas. The surface acoustic wave device is arranged so that the sample gas passing through the separation column is reacted with the reaction parts. The measuring part can measure a physical quantity of the surface acoustic wave propagating along the annular surface, and the components of the sample gas can be analyzed on the basis of the measured physical quantity.
公开/授权文献
- US20100018288A1 GAS ANALYZER AND METHOD OF GAS ANALYSIS 公开/授权日:2010-01-28
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