发明授权
- 专利标题: State machine sensing of memory cells
- 专利标题(中): 状态机检测存储单元
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申请号: US13011990申请日: 2011-01-24
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公开(公告)号: US08223537B2公开(公告)日: 2012-07-17
- 发明人: Yantao Ma , Jun Liu
- 申请人: Yantao Ma , Jun Liu
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Brooks, Cameron & Huebsch, PLLC
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
The present disclosure includes methods, devices, modules, and systems for sensing memory cells using a state machine. One method embodiment includes generating a first sensing reference according to a first output of a state machine. The method includes bifurcating a range of possible programmed levels to which a memory cell can be programmed with the first sensing reference. The method also includes generating a second sensing reference according to a second output of the state machine. The method further includes determining a programmed level of the memory cell with the second generated sensing reference.
公开/授权文献
- US20110116301A1 STATE MACHINE SENSING OF MEMORY CELLS 公开/授权日:2011-05-19
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