发明授权
US08223537B2 State machine sensing of memory cells 有权
状态机检测存储单元

State machine sensing of memory cells
摘要:
The present disclosure includes methods, devices, modules, and systems for sensing memory cells using a state machine. One method embodiment includes generating a first sensing reference according to a first output of a state machine. The method includes bifurcating a range of possible programmed levels to which a memory cell can be programmed with the first sensing reference. The method also includes generating a second sensing reference according to a second output of the state machine. The method further includes determining a programmed level of the memory cell with the second generated sensing reference.
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