发明授权
- 专利标题: Eddy current flaw detection probe
- 专利标题(中): 涡流探伤探头
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申请号: US12128316申请日: 2008-05-28
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公开(公告)号: US08228058B2公开(公告)日: 2012-07-24
- 发明人: Akira Nishimizu , Hirofumi Ouchi , Yoshio Nonaka , Yosuke Takatori , Akihiro Taki , Makoto Senoo
- 申请人: Akira Nishimizu , Hirofumi Ouchi , Yoshio Nonaka , Yosuke Takatori , Akihiro Taki , Makoto Senoo
- 申请人地址: JP Ibaraki
- 专利权人: Hitachi-GE Nuclear Energy, Ltd.
- 当前专利权人: Hitachi-GE Nuclear Energy, Ltd.
- 当前专利权人地址: JP Ibaraki
- 代理机构: Brundidge & Stanger, P.C.
- 优先权: JP2007-142428 20070529
- 主分类号: G01R33/02
- IPC分类号: G01R33/02 ; G01N27/82
摘要:
Disclosed is an eddy current flaw detection probe that is capable of pressing itself against an inspection target whose curvature varies. A flaw sensor is configured by fastening a plurality of coils to a flexible substrate that faces the surface of the inspection target. A first elastic body is positioned opposite the inspection target for the flaw sensor, is obtained by stacking two or more elastic plates, and has an elastic coefficient that varies in a longitudinal direction. A second elastic body is a porous body positioned between the flexible substrate and the first elastic body. A pressure section is employed to press the first elastic body toward the inspection target.
公开/授权文献
- US20090009162A1 EDDY CURRENT FLAW DETECTION PROBE 公开/授权日:2009-01-08