Invention Grant
- Patent Title: Antenna-characteristic measuring apparatus and antenna-characteristic measuring method
- Patent Title (中): 天线特征测量装置和天线特性测量方法
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Application No.: US12411039Application Date: 2009-03-25
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Publication No.: US08228247B2Publication Date: 2012-07-24
- Inventor: Hiroshi Kitada , Yukio Yamamoto
- Applicant: Hiroshi Kitada , Yukio Yamamoto
- Applicant Address: JP Kyoto
- Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Keating & Bennett, LLP
- Priority: JP2006-264899 20060928
- Main IPC: G01R29/10
- IPC: G01R29/10

Abstract:
A measured antenna and a measuring antenna are placed inside a radio anechoic container. On the basis of an aperture size D of the measured antenna, an aperture size d of the measuring antenna, and a wavelength λ of a measurement frequency, a distance L between the measured antenna and the measuring antenna is set to a value in the range of (D+d)2/(2λ) to 2(D+d)2/λ. Thus, in the Fresnel region where the distance L is short, antenna characteristics of the measured antenna substantially the same as those in the Fraunhofer region where the distance L is long can be measured.
Public/Granted literature
- US20090219217A1 ANTENNA-CHARACTERISTIC MEASURING APPARATUS AND ANTENNA-CHARACTERISTIC MEASURING METHOD Public/Granted day:2009-09-03
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