Invention Grant
- Patent Title: Dimensional detection system calibration method
- Patent Title (中): 尺寸检测系统校准方法
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Application No.: US13324149Application Date: 2011-12-13
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Publication No.: US08228510B2Publication Date: 2012-07-24
- Inventor: John Gregory Pangrazio , John Alan Pangrazio , Robert Thomas Pangrazio , Kenneth Lloyd Brey , Cesar Pena-Gutierrez
- Applicant: John Gregory Pangrazio , John Alan Pangrazio , Robert Thomas Pangrazio , Kenneth Lloyd Brey , Cesar Pena-Gutierrez
- Applicant Address: US OH Twinsburg
- Assignee: LTS Scale Company
- Current Assignee: LTS Scale Company
- Current Assignee Address: US OH Twinsburg
- Agency: Eckert Seamans Cherin & Mellott, LLC
- Agent Brij K. Agarwal
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01B11/00 ; G06K9/00

Abstract:
An improved dimensional detection system is portable and can be used to characterize a workpiece. The dimensional detection system employs as few as a single focused light source and as few as a single camera along with a calibration data set to convert the illuminated pixels of an image of a beam on the workpiece into a cloud of real world points in space on an outer surface of the workpiece. The cloud of points can be processed to characterize the workpiece, such as by determining the right hexahedron that would encompass all of the real world points in space and which could be used to determine a dimensional weight of the workpiece.
Public/Granted literature
- US20120081714A1 Dimensional Detection System Calibration Method Public/Granted day:2012-04-05
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