Invention Grant
US08228972B2 SERDES with jitter-based built-in self test (BIST) for adapting FIR filter coefficients
有权
SERDES具有基于抖动的内置自检(BIST),适用于FIR滤波器系数
- Patent Title: SERDES with jitter-based built-in self test (BIST) for adapting FIR filter coefficients
- Patent Title (中): SERDES具有基于抖动的内置自检(BIST),适用于FIR滤波器系数
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Application No.: US12132923Application Date: 2008-06-04
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Publication No.: US08228972B2Publication Date: 2012-07-24
- Inventor: Davide Tonietto , John Hogeboom
- Applicant: Davide Tonietto , John Hogeboom
- Applicant Address: US TX Coppell
- Assignee: STMicroelectronics, Inc.
- Current Assignee: STMicroelectronics, Inc.
- Current Assignee Address: US TX Coppell
- Agency: Gardene Wynne Sewell LLP
- Main IPC: H04B1/38
- IPC: H04B1/38

Abstract:
A first device transmits data over a first branch of a communications link toward a second device. That second device loops the received data pattern back over a second branch of the communications link. A bit error rate of the looped back data pattern is determined and a pre-emphasis applied to the transmitted data pattern is adjusted in response thereto. The first device further perturbs the data pattern communications signal so as to increase the bit error rate. The pre-emphasis is adjusted so as to reduce the determined bit error rate in the looped back data pattern in the presence of the perturbation. The steps for perturbing the signal and adjusting the pre-emphasis are iteratively performed, with the perturbation of the signal increasing with each iteration and adjustment of the pre-emphasis being refined with each iteration. The signal is perturbing by injecting modulation jitter into the signal (increasing each iteration) and adjusting amplitude of the signal (decreasing each iteration).
Public/Granted literature
- US20090304054A1 SERDES WITH JITTER-BASED BUILT-IN SELF TEST (BIST) FOR ADAPTING FIR FILTER COEFFICIENTS Public/Granted day:2009-12-10
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