Invention Grant
- Patent Title: Methods and systems for maximum-likelihood detection using post-squaring compensation
- Patent Title (中): 使用后平方补偿的最大似然检测方法和系统
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Application No.: US12211928Application Date: 2008-09-17
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Publication No.: US08229013B2Publication Date: 2012-07-24
- Inventor: Jong Hyeon Park , Allert van Zelst , Brian Clarke Banister , Je Woo Kim , Matthias Brehler , Vincent K. Jones, IV
- Applicant: Jong Hyeon Park , Allert van Zelst , Brian Clarke Banister , Je Woo Kim , Matthias Brehler , Vincent K. Jones, IV
- Applicant Address: US CA San Diego
- Assignee: Qualcomm Incorporated
- Current Assignee: Qualcomm Incorporated
- Current Assignee Address: US CA San Diego
- Agent Tyler Overall
- Main IPC: H04L5/12
- IPC: H04L5/12 ; H03D1/00

Abstract:
A “post-squaring” detection algorithm, and related devices, that may reduce the complexity of maximum likelihood detection (MLD) schemes while preserving their performance is provided. Rather than search for optimum metrics (such as minimum distance metrics) based on squared norm values, a search may be based on un-squared norm metrics, and the squaring may be postponed, for example, until subsequent log-likelihood ratio (LLR) computation. For certain embodiments, approximations of un-squared norm values may significantly reduce computation complexity.
Public/Granted literature
- US20100067597A1 METHODS AND SYSTEMS FOR MAXIMUM-LIKELIHOOD DETECTION USING POST-SQUARING COMPENSATION Public/Granted day:2010-03-18
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