发明授权
- 专利标题： Apparatus for measuring IQ imbalance
- 专利标题（中）： IQ不平衡测量装置
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申请号： US12034627申请日： 2008-02-20
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公开(公告)号： US08229028B2公开(公告)日： 2012-07-24
- 发明人: Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
- 申请人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
- 申请人地址： US CA San Jose
- 专利权人： GCT Semiconductor, Inc.
- 当前专利权人： GCT Semiconductor, Inc.
- 当前专利权人地址： US CA San Jose
- 代理机构： Muir Patent Consulting, PLLC
- 主分类号： H04K1/02
- IPC分类号： H04K1/02
摘要：
The present invention relates to an apparatus and a method for measuring an in phase and quadrature (IQ) imbalance. One embodiment according to the present general inventive concept can provide a method for measuring a Tx IQ imbalance generated in an IQ up-conversion mixer and an Rx IQ imbalance generated in an IQ down-conversion mixer, that includes measuring a first IQ imbalance corresponding to a first combination of the Rx IQ imbalance with the Tx IQ imbalance, measuring a second IQ imbalance corresponding to a second combination of the Rx IQ imbalance with the Tx IQ imbalance and obtaining the Tx IQ imbalance and the Rx IQ imbalance from the first IQ imbalance and the second IQ imbalance.
公开/授权文献
- US20090028231A1 APPARATUS FOR MEASURING IQ IMBALANCE 公开/授权日：2009-01-29
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