Invention Grant
US08230263B2 Automated specification based functional test generation infrastructure
失效
基于自动规范的功能测试生成基础设施
- Patent Title: Automated specification based functional test generation infrastructure
- Patent Title (中): 基于自动规范的功能测试生成基础设施
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Application No.: US12212736Application Date: 2008-09-18
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Publication No.: US08230263B2Publication Date: 2012-07-24
- Inventor: Debaditya Mukherjee , Anil Raj Gopalakrishnan
- Applicant: Debaditya Mukherjee , Anil Raj Gopalakrishnan
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agent Christopher P. Maiorana, PC
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F17/50
Abstract:
A method comprising the steps of (A) generating a code, (B) applying one or more constraint constructs to the code, (C) generating a coverage code and a second code in response to applying the constraint constructs to the code, (D) generating a third code in response to the code, and (E) generating one or more assembly language tests in response to the second code.
Public/Granted literature
- US20090235121A1 AUTOMATED SPECIFICATION BASED FUNCTIONAL TEST GENERATION INFRASTRUCTURE Public/Granted day:2009-09-17
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