Invention Grant
US08230593B2 Probe bonding method having improved control of bonding material 有权
探针接合方法,改善了接合材料的控制

  • Patent Title: Probe bonding method having improved control of bonding material
  • Patent Title (中): 探针接合方法,改善了接合材料的控制
  • Application No.: US12156131
    Application Date: 2008-05-29
  • Publication No.: US08230593B2
    Publication Date: 2012-07-31
  • Inventor: January Kister
  • Applicant: January Kister
  • Applicant Address: US CA Carlsbad
  • Assignee: MicroProbe, Inc.
  • Current Assignee: MicroProbe, Inc.
  • Current Assignee Address: US CA Carlsbad
  • Agency: Peacock Myers, P.C.
  • Agent Deborah A. Peacock; Samantha A. Updegraff
  • Main IPC: H01R43/00
  • IPC: H01R43/00
Probe bonding method having improved control of bonding material
Abstract:
In assembly of probe arrays for electrical test, a problem can arise where a bonding agent undesirably wicks between probes. According to embodiments of the invention, this wicking problem is alleviated by disposing an anti-wicking agent on a surface of the probe assembly such that wicking of the bonding agent along the probes toward the probe tips is hindered. The anti-wicking agent can be a solid powder, a liquid, or a gel. Once probe assembly fabrication is complete, the anti-wicking agent is removed. In preferred embodiments, a template plate is employed to hold the probe tips in proper position during fabrication. In this manner, undesirable bending of probes caused by introduction or removal of the anti-wicking agent can be reduced or eliminated.
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