Invention Grant
- Patent Title: Probe bonding method having improved control of bonding material
- Patent Title (中): 探针接合方法,改善了接合材料的控制
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Application No.: US12156131Application Date: 2008-05-29
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Publication No.: US08230593B2Publication Date: 2012-07-31
- Inventor: January Kister
- Applicant: January Kister
- Applicant Address: US CA Carlsbad
- Assignee: MicroProbe, Inc.
- Current Assignee: MicroProbe, Inc.
- Current Assignee Address: US CA Carlsbad
- Agency: Peacock Myers, P.C.
- Agent Deborah A. Peacock; Samantha A. Updegraff
- Main IPC: H01R43/00
- IPC: H01R43/00

Abstract:
In assembly of probe arrays for electrical test, a problem can arise where a bonding agent undesirably wicks between probes. According to embodiments of the invention, this wicking problem is alleviated by disposing an anti-wicking agent on a surface of the probe assembly such that wicking of the bonding agent along the probes toward the probe tips is hindered. The anti-wicking agent can be a solid powder, a liquid, or a gel. Once probe assembly fabrication is complete, the anti-wicking agent is removed. In preferred embodiments, a template plate is employed to hold the probe tips in proper position during fabrication. In this manner, undesirable bending of probes caused by introduction or removal of the anti-wicking agent can be reduced or eliminated.
Public/Granted literature
- US20090293274A1 Probe bonding method having improved control of bonding material Public/Granted day:2009-12-03
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