发明授权
US08232084B2 Device for measuring extracellular potential and method of manufacturing device
有权
用于测量细胞外电位的装置和制造装置的方法
- 专利标题: Device for measuring extracellular potential and method of manufacturing device
- 专利标题(中): 用于测量细胞外电位的装置和制造装置的方法
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申请号: US12245091申请日: 2008-10-03
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公开(公告)号: US08232084B2公开(公告)日: 2012-07-31
- 发明人: Masaya Nakatani , Hiroaki Oka , Fumiaki Emoto
- 申请人: Masaya Nakatani , Hiroaki Oka , Fumiaki Emoto
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: Wenderoth, Lind & Ponack, L.L.P.
- 优先权: JP2002-163934 20020605; JP2002-224563 20020801
- 主分类号: C12N13/00
- IPC分类号: C12N13/00 ; C12M1/42 ; C12M3/00
摘要:
A device for measuring an extracellular potential of a test cell includes a substrate having a well formed in a first surface thereof and a first trap hole formed therein. The well has a bottom. The first trap hole includes a first opening formed in the bottom of the well and extending toward a second face of the substrate, a first hollow section communicating with the first opening via a first connecting portion, and a second opening extending reaching the second surface and communicating with the first hollow section via a second connecting portion. The first connecting portion has a diameter smaller than a maximum diameter of the first hollow section, greater than a diameter of the second connecting portion, and smaller than a diameter of the test cell. The device can retain the test cell securely and accept chemicals and the test cell to be put into the device easily.
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