发明授权
US08232552B2 Noncrystalline oxide semiconductor thin film, process for producing the noncrystalline oxide semiconductor thin film, process for producing thin-film transistor, field-effect-transistor, light emitting device, display device, and sputtering target 有权
非晶氧化物半导体薄膜,用于制造非结晶氧化物半导体薄膜的工艺,薄膜晶体管的制造工艺,场效应晶体管,发光器件,显示器件和溅射靶

  • 专利标题: Noncrystalline oxide semiconductor thin film, process for producing the noncrystalline oxide semiconductor thin film, process for producing thin-film transistor, field-effect-transistor, light emitting device, display device, and sputtering target
  • 专利标题(中): 非晶氧化物半导体薄膜,用于制造非结晶氧化物半导体薄膜的工艺,薄膜晶体管的制造工艺,场效应晶体管,发光器件,显示器件和溅射靶
  • 申请号: US12593045
    申请日: 2008-03-26
  • 公开(公告)号: US08232552B2
    公开(公告)日: 2012-07-31
  • 发明人: Koki YanoKazuyoshi Inoue
  • 申请人: Koki YanoKazuyoshi Inoue
  • 申请人地址: JP Tokyo
  • 专利权人: Idemitsu Kosan Co., Ltd.
  • 当前专利权人: Idemitsu Kosan Co., Ltd.
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Millen, White, Zelano & Branigan PC
  • 优先权: JP2007-078996 20070326
  • 国际申请: PCT/JP2008/055634 WO 20080326
  • 国际公布: WO2008/117810 WO 20081002
  • 主分类号: H01L29/10
  • IPC分类号: H01L29/10 H01L29/12
Noncrystalline oxide semiconductor thin film, process for producing the noncrystalline oxide semiconductor thin film, process for producing thin-film transistor, field-effect-transistor, light emitting device, display device, and sputtering target
摘要:
This invention provides an amorphous oxide semiconductor thin film, which is insoluble in a phosphoric acid-based etching solution and is soluble in an oxalic acid-based etching solution by optimizing the amounts of indium, tin, and zinc, a method of producing the amorphous oxide semiconductor thin film, etc. An image display device (1) comprises a glass substrate (10), a liquid crystal (40) as a light control element, a bottom gate-type thin film transistor (1) for driving the liquid crystal (40), a pixel electrode (30), and an opposing electrode (50). The amorphous oxide semiconductor thin film (2) in the bottom gate-type thin film transistor (1) has a carrier density of less than 10+18 cm−3, is insoluble in a phosphoric acid-based etching liquid, and is soluble in an oxalic acid-based etching liquid.
信息查询
IPC分类:
H 电学
H01 基本电气元件
H01L 半导体器件;其他类目中不包括的电固体器件(使用半导体器件的测量入G01;一般电阻器入H01C;磁体、电感器、变压器入H01F;一般电容器入H01G;电解型器件入H01G9/00;电池组、蓄电池入H01M;波导管、谐振器或波导型线路入H01P;线路连接器、汇流器入H01R;受激发射器件入H01S;机电谐振器入H03H;扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R;一般电光源入H05B;印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K;在具有特殊应用的电路中使用的半导体器件见应用相关的小类)
H01L29/00 专门适用于整流、放大、振荡或切换,并具有至少一个电位跃变势垒或表面势垒的半导体器件;具有至少一个电位跃变势垒或表面势垒,例如PN结耗尽层或载流子集结层的电容器或电阻器;半导体本体或其电极的零部件(H01L31/00至H01L47/00,H01L51/05优先;除半导体或其电极之外的零部件入H01L23/00;由在一个共用衬底内或其上形成的多个固态组件组成的器件入H01L27/00)
H01L29/02 .按其半导体本体的特征区分的
H01L29/06 ..按其形状区分的;按各半导体区域的形状、相对尺寸或配置区分的
H01L29/10 ...具有连接到1个不通有待整流、放大或切换的电流的电极上去的半导体区域的;并且这样的电极又是包含3个或更多个电极的半导体器件的组成部分的
0/0