发明授权
- 专利标题: Spectrometer and a method for controlling the spectrometer
- 专利标题(中): 光谱仪和控制光谱仪的方法
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申请号: US12524335申请日: 2008-01-23
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公开(公告)号: US08233147B2公开(公告)日: 2012-07-31
- 发明人: Heikki Saari
- 申请人: Heikki Saari
- 申请人地址: FI Espoo
- 专利权人: Valtion Teknillinen Tutkimuskeskus
- 当前专利权人: Valtion Teknillinen Tutkimuskeskus
- 当前专利权人地址: FI Espoo
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: GB0701536.5 20070126
- 国际申请: PCT/FI2008/050023 WO 20080123
- 国际公布: WO2008/090261 WO 20080731
- 主分类号: G01J3/28
- IPC分类号: G01J3/28
摘要:
The invention relates to a spectrometer for material analysis and to a control method for a spectrometer. The spectrometer includes a radiant source (140) formed by multiple single radiation sources (141) having different central wavelengths, for generating a measuring signal, a measurement object (100) containing a material to be analyzed, at least one electrically tunable Fabry-Perot filter (120, 220) for the band pass filtering the measuring signal by at least two pass bands, and a detector (300, 400) for detecting said filtered measuring signals received from the measurement object (100). The spectrometer has: means (312) for modulating each of the single radiation sources (141) and correspondingly means (307, 309) for demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector (300, 400); and means for detecting (300, 400) and demodulating (306, 307) multiple pass hands simultaneously.
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