发明授权
US08233147B2 Spectrometer and a method for controlling the spectrometer 有权
光谱仪和控制光谱仪的方法

Spectrometer and a method for controlling the spectrometer
摘要:
The invention relates to a spectrometer for material analysis and to a control method for a spectrometer. The spectrometer includes a radiant source (140) formed by multiple single radiation sources (141) having different central wavelengths, for generating a measuring signal, a measurement object (100) containing a material to be analyzed, at least one electrically tunable Fabry-Perot filter (120, 220) for the band pass filtering the measuring signal by at least two pass bands, and a detector (300, 400) for detecting said filtered measuring signals received from the measurement object (100). The spectrometer has: means (312) for modulating each of the single radiation sources (141) and correspondingly means (307, 309) for demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector (300, 400); and means for detecting (300, 400) and demodulating (306, 307) multiple pass hands simultaneously.
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