Invention Grant
- Patent Title: Semiconductor apparatus and chip selection method thereof
- Patent Title (中): 半导体装置及其芯片选择方法
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Application No.: US12650501Application Date: 2009-12-30
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Publication No.: US08243485B2Publication Date: 2012-08-14
- Inventor: Sin Hyun Jin , Jong Chern Lee
- Applicant: Sin Hyun Jin , Jong Chern Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2009-0103597 20091029
- Main IPC: G11C5/02
- IPC: G11C5/02

Abstract:
A semiconductor apparatus having a plurality of stacked chips includes: a plurality of latch units, each of which is disposed in a corresponding one of the plurality of chips and is configured to latch a clock signal and a frequency-divided signal at mutually different points of time to generate an chip identification signal of the corresponding one of the plurality of chips; and a plurality of chip selection signal generating units, each of which is disposed in the corresponding one of the plurality of chips and is configured to compare the chip identification signal of the corresponding one of the plurality of chips with a chip selection identification signal to generate a chip selection signal of the corresponding one of the plurality of chips, wherein the chip selection signal is configured to enable the corresponding one of the plurality of chips when the chip identification signal matches the chip selection identification signal.
Public/Granted literature
- US20110102065A1 SEMICONDUCTOR APPARATUS AND CHIP SELECTION METHOD THEREOF Public/Granted day:2011-05-05
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