Invention Grant
- Patent Title: Surface geometry characters measuring gauge
- Patent Title (中): 表面几何字符测量仪
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Application No.: US12648042Application Date: 2009-12-28
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Publication No.: US08245411B2Publication Date: 2012-08-21
- Inventor: Zih-Wei Wang
- Applicant: Zih-Wei Wang
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN200910301253 20090401
- Main IPC: G01B3/14
- IPC: G01B3/14

Abstract:
An exemplary surface geometry characters measuring gauge includes a chassis, a spindle, a locating assembly, and a micrometer. The spindle is rotatably mounted on a surface of the chassis. The locating assembly is mounted on the spindle and structured and arranged for fastening a workpiece on the spindle. The micrometer is attached on the chassis corresponding to and spaced from the spindle. The micrometer is configured for contacting a surface of the workpiece and measuring one or more surface geometry characters of the workpiece.
Public/Granted literature
- US20100251559A1 SURFACE GEOMETRY CHARACTERS MEASURING GAUGE Public/Granted day:2010-10-07
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