发明授权
- 专利标题: Process for manufacturing platinum temperature-measuring resistance element
- 专利标题(中): 铂温度测量电阻元件的制造工艺
-
申请号: US12600756申请日: 2008-05-19
-
公开(公告)号: US08247040B2公开(公告)日: 2012-08-21
- 发明人: Hideo Kimura , Kazuya Yoneshita , Toru Yamaguchi
- 申请人: Hideo Kimura , Kazuya Yoneshita , Toru Yamaguchi
- 申请人地址: JP Tokyo
- 专利权人: Azbil Corporation
- 当前专利权人: Azbil Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2007-133394 20070518
- 国际申请: PCT/JP2008/059157 WO 20080519
- 国际公布: WO2008/143222 WO 20081127
- 主分类号: B05D3/02
- IPC分类号: B05D3/02 ; B05D3/04 ; B05D3/06 ; G01K1/00 ; G01K7/00
摘要:
The process for manufacturing a platinum temperature-measuring resistance element comprises the step of preparing a thermosensitive part having a portion to be sealed coated with a glaze; the step of placing a pre-sealing element on a tray and inserting the same in a chamber; the step of enclosing a purge gas containing an inert gas and oxygen in the chamber; the step of raising the internal temperature of the chamber to a region in which the platinum is in reduced form at a partial pressure of oxygen in the purge gas as determined from platinum oxide formation free energy; the step of replacing the purge gas with an inert gas wherein oxygen is 1 kPa or below; and the step of under the replaced condition, rapidly heating the furnace interior (interior of the chamber) to a fit melting temperature by means of a lamp heating unit to thereby seal the portion to be sealed of the thermosensitive part.