发明授权
US08247272B2 Copper on organic solderability preservative (OSP) interconnect and enhanced wire bonding process
有权
铜上有机可焊性防腐剂(OSP)互连和增强引线接合工艺
- 专利标题: Copper on organic solderability preservative (OSP) interconnect and enhanced wire bonding process
- 专利标题(中): 铜上有机可焊性防腐剂(OSP)互连和增强引线接合工艺
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申请号: US12489409申请日: 2009-06-22
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公开(公告)号: US08247272B2公开(公告)日: 2012-08-21
- 发明人: Yong Chuan Koh , Jimmy Siat , Jeffrey Nantes Salamat , Lope Vallespin Pepito, Jr. , Ronaldo Cayetano Calderon , Rodel Manalac , Pang Hup Ong , Kian Teng Eng
- 申请人: Yong Chuan Koh , Jimmy Siat , Jeffrey Nantes Salamat , Lope Vallespin Pepito, Jr. , Ronaldo Cayetano Calderon , Rodel Manalac , Pang Hup Ong , Kian Teng Eng
- 申请人地址: SG Singapore
- 专利权人: United Test and Assembly Center Ltd.
- 当前专利权人: United Test and Assembly Center Ltd.
- 当前专利权人地址: SG Singapore
- 代理机构: Horizon IP Pte Ltd
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L21/44
摘要:
A semiconductor package and a method for constructing the package are disclosed. The package includes a substrate and a die attached thereto. A first contact region is disposed on the substrate and a second contact region is disposed on the die. The first contact region, for example, comprises copper coated with an OSP material. A copper wire bond electrically couples the first and second contact regions. Wire bonding includes forming a ball bump on the first contact region having a flat top surface. Providing the flat top surface is achieved with a smoothing process. A ball bond is formed on the second contact region, followed by stitching the wire onto the flat top surface of the ball bump on the first contact region.
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