Invention Grant
US08248356B2 Driving circuit for detecting line short defects 有权
用于检测线路短路缺陷的驱动电路

  • Patent Title: Driving circuit for detecting line short defects
  • Patent Title (中): 用于检测线路短路缺陷的驱动电路
  • Application No.: US12257407
    Application Date: 2008-10-24
  • Publication No.: US08248356B2
    Publication Date: 2012-08-21
  • Inventor: Chih-Ping Chen
  • Applicant: Chih-Ping Chen
  • Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
  • Assignee: AU Optronics Corp.
  • Current Assignee: AU Optronics Corp.
  • Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
  • Agent Winston Hsu; Scott Margo
  • Main IPC: G09G3/36
  • IPC: G09G3/36
Driving circuit for detecting line short defects
Abstract:
For detecting line short defects in a display panel, a driving circuit has a plurality of shift registers, a plurality of diode modules, and at least one power supply. Each shift register has an output port for outputting a driving signal sequentially. The diode modules are coupled to the output ports of the shift registers accordingly. The power supply is coupled to the diode modules and forward biases the diode modules to bypass the shift registers during at least a part of a period of detecting line short defects.
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