发明授权
- 专利标题: Memory device using a variable resistive element
- 专利标题(中): 使用可变电阻元件的存储器件
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申请号: US12659840申请日: 2010-03-23
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公开(公告)号: US08248860B2公开(公告)日: 2012-08-21
- 发明人: Kwang-Jin Lee , Chang-Soo Lee , Joon-Min Park , Hui-Kwon Seo , Qi Wang
- 申请人: Kwang-Jin Lee , Chang-Soo Lee , Joon-Min Park , Hui-Kwon Seo , Qi Wang
- 申请人地址: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 代理机构: Muir Patent Consulting, PLLC
- 优先权: KR10-2009-0025479 20090325
- 主分类号: G11C16/04
- IPC分类号: G11C16/04
摘要:
A memory device includes a memory cell array including a plurality of memory blocks, each memory block including a plurality of memory cells, a plurality of word lines coupled to rows of the plurality of memory cells, a plurality of bit lines coupled to columns of the plurality of memory cells, and a control unit controlling an erase operation so that erase data is simultaneously written in the plurality of memory cells corresponding to an erase unit. A first erase mode may include a first erase unit and a first erase data pattern. A second erase mode may include a second erase unit and a second erase pattern. At least one of the first and second erase units and the first and second erase data patterns are different.
公开/授权文献
- US20100246239A1 Memory device using a variable resistive element 公开/授权日:2010-09-30
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