Invention Grant
- Patent Title: Memory device using a variable resistive element
- Patent Title (中): 使用可变电阻元件的存储器件
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Application No.: US12659840Application Date: 2010-03-23
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Publication No.: US08248860B2Publication Date: 2012-08-21
- Inventor: Kwang-Jin Lee , Chang-Soo Lee , Joon-Min Park , Hui-Kwon Seo , Qi Wang
- Applicant: Kwang-Jin Lee , Chang-Soo Lee , Joon-Min Park , Hui-Kwon Seo , Qi Wang
- Applicant Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Muir Patent Consulting, PLLC
- Priority: KR10-2009-0025479 20090325
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A memory device includes a memory cell array including a plurality of memory blocks, each memory block including a plurality of memory cells, a plurality of word lines coupled to rows of the plurality of memory cells, a plurality of bit lines coupled to columns of the plurality of memory cells, and a control unit controlling an erase operation so that erase data is simultaneously written in the plurality of memory cells corresponding to an erase unit. A first erase mode may include a first erase unit and a first erase data pattern. A second erase mode may include a second erase unit and a second erase pattern. At least one of the first and second erase units and the first and second erase data patterns are different.
Public/Granted literature
- US20100246239A1 Memory device using a variable resistive element Public/Granted day:2010-09-30
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