发明授权
US08258472B2 Charged particle radiation device and image capturing condition determining method using charged particle radiation device
有权
带电粒子辐射装置和使用带电粒子辐射装置的图像捕获条件确定方法
- 专利标题: Charged particle radiation device and image capturing condition determining method using charged particle radiation device
- 专利标题(中): 带电粒子辐射装置和使用带电粒子辐射装置的图像捕获条件确定方法
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申请号: US13142153申请日: 2009-11-19
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公开(公告)号: US08258472B2公开(公告)日: 2012-09-04
- 发明人: Tamotsu Shindo , Yuji Tange
- 申请人: Tamotsu Shindo , Yuji Tange
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2008-331826 20081226
- 国际申请: PCT/JP2009/006207 WO 20091119
- 国际公布: WO2010/073478 WO 20100701
- 主分类号: G01N23/22
- IPC分类号: G01N23/22 ; H01J37/28 ; H01J37/26
摘要:
A charged particle radiation device wherein the position or the size of a FOV can be easily determined even if a number of measuring points are provided on a sample, and an image capturing condition determining method using the charged particle radiation device are provided. An image capturing condition determining method wherein the field of view of a charged particle radiation device is determined so as to include a plurality of measuring points, characterized in that whether or not the measuring points are overlapped with four sides of the field of view is judged; the field of view is moved so that the measuring points are moved to the inside or outside of the field of view; and the position of the field of view after being moved is determined as a position of the field of view of the charged particle radiation device, and a device to realize the method are proposed. Further, a method for judging whether or not the measuring points are overlapped with the four sides, and changing the size of the field of view so as not to overlap the measuring points with each side, and a device therefor are proposed.
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