发明授权
- 专利标题: Adaptable detection threshold for RFID tags and chips
- 专利标题(中): 适用于RFID标签和芯片的检测阈值
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申请号: US13012413申请日: 2011-01-24
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公开(公告)号: US08258955B1公开(公告)日: 2012-09-04
- 发明人: John D. Hyde , Kurt E. Sundstrom
- 申请人: John D. Hyde , Kurt E. Sundstrom
- 申请人地址: US WA Seattle
- 专利权人: Impinj, Inc.
- 当前专利权人: Impinj, Inc.
- 当前专利权人地址: US WA Seattle
- 代理机构: Turk IP Law, LLC
- 主分类号: H04B7/00
- IPC分类号: H04B7/00 ; H04B1/16 ; G05B11/01 ; G08C19/16
摘要:
RFID tags, tag circuits, and methods are provided that reduce at least in part the distortion to received wireless signals, which is caused by interference in the environment. Two or more thresholds are used to digitize the received signal implemented by two or more demodulators. Multiple low pass and digital filters may be implemented with the demodulators, allowing removal of narrow pulses caused by the interference and reduction of beat tone amplitude.
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