发明授权
- 专利标题: Optically testing chiplets in display device
- 专利标题(中): 在显示设备中光学测试小巧
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申请号: US12544286申请日: 2009-08-20
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公开(公告)号: US08259095B2公开(公告)日: 2012-09-04
- 发明人: Ronald S. Cok , John W. Hamer , Michael W. Mattern
- 申请人: Ronald S. Cok , John W. Hamer , Michael W. Mattern
- 申请人地址: US VA Herndon
- 专利权人: Global OLED Technology LLC
- 当前专利权人: Global OLED Technology LLC
- 当前专利权人地址: US VA Herndon
- 代理机构: Morgan, Lewis & Bockius LLP
- 主分类号: G09G5/00
- IPC分类号: G09G5/00
摘要:
A method of making a display includes providing a display substrate having a plurality of control electrodes in a display area; locating a plurality of chiplets responsive to a controller to provide current to the control electrodes, each chiplet having a separate substrate, at least one pixel connection pad electrically connected to a control electrode, and one or more test light emitters formed in the chiplet responsive to the current provided on the control electrodes to emit light; controlling the chiplets to pass current through one or more of the test light emitters formed in the chiplet to emit light; detecting the light emitted by the test light emitters to determine faulty chiplets or chiplet interconnections; replacing or repairing the faulty chiplets or chiplet interconnections; and forming an organic light emitting diode over the substrate in the display area connected to the control electrodes.
公开/授权文献
- US20110043499A1 OPTICALLY TESTING CHIPLETS IN DISPLAY DEVICE 公开/授权日:2011-02-24