发明授权
US08260727B2 Method and apparatus for estimating a factor/defect affecting quality/reliability wherein the priority of user input data is determined
失效
用于估计影响质量/可靠性的因素/缺陷的方法和装置，其中确定用户输入数据的优先级
- 专利标题： Method and apparatus for estimating a factor/defect affecting quality/reliability wherein the priority of user input data is determined
- 专利标题（中）： 用于估计影响质量/可靠性的因素/缺陷的方法和装置，其中确定用户输入数据的优先级
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申请号： US11695926申请日： 2007-04-03
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公开(公告)号： US08260727B2公开(公告)日： 2012-09-04
- 发明人: Junpei Koga , Yasuaki Nakajima , Kazuto Kojitani
- 申请人： Junpei Koga , Yasuaki Nakajima , Kazuto Kojitani
- 申请人地址： JP Kyoto
- 专利权人： Omron Corporation
- 当前专利权人： Omron Corporation
- 当前专利权人地址： JP Kyoto
- 代理机构： Foley & Lardner LLP
- 优先权： JPP2006-102239 20060403
- 主分类号： G06F15/18
- IPC分类号： G06F15/18
摘要：
A factor estimation apparatus which can appropriately estimate a factor without increase in the cost, the factor estimation apparatus includes a characteristic quantity determination unit which determines the characteristic quantity; a user input unit which accepts an input from a user as data for the characteristic quantity determined by the characteristic quantity determination unit; an apparatus-data input unit to which data is inputted from a data obtaining device as the data for the characteristic quantity determined by the characteristic quantity determination unit; an input source defining unit which previously determines that the data for the characteristic quantity is inputted from which one of the user input unit and the apparatus-data input unit; and an estimation unit which estimates the factor using the data inputted from the input unit determined by the input source defining unit.