发明授权
- 专利标题: Two pass erase for non-volatile storage
- 专利标题(中): 两路擦除用于非易失性存储
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申请号: US12835423申请日: 2010-07-13
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公开(公告)号: US08264890B2公开(公告)日: 2012-09-11
- 发明人: Nima Mokhlesi , Dana Lee , Anubhav Khandelwal
- 申请人: Nima Mokhlesi , Dana Lee , Anubhav Khandelwal
- 申请人地址: US TX Plano
- 专利权人: SanDisk Technologies Inc.
- 当前专利权人: SanDisk Technologies Inc.
- 当前专利权人地址: US TX Plano
- 代理机构: Vierra Magen Marcus & DeNiro LLP
- 主分类号: G11C16/04
- IPC分类号: G11C16/04
摘要:
Techniques are disclosed herein for erasing non-volatile memory cells. A subset of the memory cells are pre-conditioned prior to erase. The pre-conditioning alters the threshold voltage of the memory cells in a way that may help make later calculations more accurate. As an example, memory cells along a single word line might be pre-conditioned. After the pre-conditioning, the memory cells are erased using a trial erase pulse. A suitable magnitude for a second pulse is determined based on the magnitude of the trial erase pulse and data collected about the threshold voltage distribution after the trial erase. The second erase pulse is used to erase the memory cells. Determining an appropriate magnitude for the second erase pulse minimizes or eliminates over-erasing.
公开/授权文献
- US20100277983A1 Two Pass Erase For Non-Volatile Storage 公开/授权日:2010-11-04
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