发明授权
US08266485B2 Test mode soft reset circuitry and methods 有权
测试模式软复位电路和方法

Test mode soft reset circuitry and methods
摘要:
A soft-function trigger state machine includes state machine logic defined to use a scan-in waveform to sample a scan-clock waveform to obtain a sampled data pattern. The state machine logic is defined to compare the sampled data pattern to a soft action pattern to determine whether the sampled data pattern matches the soft action pattern. The state machine logic is also defined to trigger an action associated with the soft action pattern when the sampled data pattern matches the soft action pattern.
公开/授权文献
信息查询
0/0