Invention Grant
- Patent Title: Mask and blank storage inner gas
- Patent Title (中): 面罩和空白存储内部气体
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Application No.: US11733471Application Date: 2007-04-10
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Publication No.: US08268541B2Publication Date: 2012-09-18
- Inventor: Cheng-Ming Lin , Chue San Yoo
- Applicant: Cheng-Ming Lin , Chue San Yoo
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
The present disclosure provides a lithography apparatus. The lithography apparatus includes a radiation source providing a radiation energy with a wavelength selected from the group consisting of 193 nm, 248 nm, and 365 nm; a lens system configured approximate to the radiation source; a mask chamber proximate to the lens system, configured to hold a mask and operable to provide a single atom gas to the mask chamber; and a substrate stage configured to hold a substrate and receive the radiation energy through the lens system and the mask during an exposing process.
Public/Granted literature
- US20080206683A1 MASK AND BLANK STORAGE INNER GAS Public/Granted day:2008-08-28
Information query
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