Invention Grant
- Patent Title: Optical measuring apparatus
- Patent Title (中): 光学测量仪器
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Application No.: US12480042Application Date: 2009-06-08
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Publication No.: US08279438B2Publication Date: 2012-10-02
- Inventor: Tomoyu Yamashita , Motoki Imamura
- Applicant: Tomoyu Yamashita , Motoki Imamura
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2008-159349 20080618
- Main IPC: G01J3/40
- IPC: G01J3/40

Abstract:
An object is to enable a change in a frequency for which an electric signal based on an optical signal is measured by a spectrum analyzer. An optical measurement device includes a first photoconductive switch that receives predetermined pulse light from a first laser light source, and outputs terahertz light having the same repetition frequency as the repetition frequency of the predetermined pulse light. The optical measurement device also includes a second photoconductive switch that receives the terahertz light and a sampling light pulse, and outputs a signal corresponding to a power of the terahertz light at a time point when the sampling light pulse is received. The optical measurement device further includes an RF spectrum analyzer that measures a magnitude of the signal corresponding to a measured frequency that changes over time, an optical coupler that outputs a simultaneous light pulse when the predetermined pulse light and the sampling light pulse are simultaneously input, a photo detector that converts the simultaneous light pulse into an electric signal as a trigger signal, and an optical delay circuit that delays the trigger signal.
Public/Granted literature
- US20100014079A1 OPTICAL MEASURING APPARATUS Public/Granted day:2010-01-21
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