发明授权
- 专利标题: Method for optical measurement of the three dimensional geometry of objects
- 专利标题(中): 光学测量物体三维几何的方法
-
申请号: US12770426申请日: 2010-04-29
-
公开(公告)号: US08280152B2公开(公告)日: 2012-10-02
- 发明人: Frank Thiel , Joachim Pfeiffer
- 申请人: Frank Thiel , Joachim Pfeiffer
- 申请人地址: DE Bensheim
- 专利权人: Sirona Dental Systems GmbH
- 当前专利权人: Sirona Dental Systems GmbH
- 当前专利权人地址: DE Bensheim
- 代理机构: Fitzpatrick, Cella, Harper & Scinto
- 优先权: DE102007054906 20071115
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
The invention relates to a method for optically scanning the three-dimensional geometry of an object by means of triangulation, in which a pattern (9, 9′) is projected onto the object (7) to be scanned in order to obtain a 3D data set, and the projected pattern (9, 9′) is recorded in an image (40, 41). In a first step for the production of at least one first image (40), a first pattern (9) is projected and in a second step for the creation of at least one further image (40), a further pattern (9′) deviating from the first as regards position or shape is projected onto the object (7) to be scanned and the image (41) is created. The first image (40) and the further image (41) comprise at least one common point (44). The 3D data acquired from the images (40, 41) are merged in a subsequent step on the basis of the 3D data of the at least one common point (44) such that the 3D data acquired from said images (40, 41) agree at least with reference to the 3D data of the common point (44) in the 3D data set.