发明授权
US08280713B2 Automatic generation of test suite for processor architecture compliance 有权
自动生成用于处理器架构合规性的测试套件

Automatic generation of test suite for processor architecture compliance
摘要:
A parametrically controlled model-based test generator automatically generates architectural compliance test suites for different implementations of a processor architecture, based on a set of architectural decisions chosen among optional behaviors for each implementation. Thus, different implementations of the same architecture can be easily supported by modifying the parameter values. In addition, ongoing changes to the architecture or comprehensive updates to the test suite can be easily handled by updating the architecture model or the coverage models, forgoing the need to review the whole, potentially huge, set of tests.
信息查询
0/0