Invention Grant
- Patent Title: Detection of fuse re-growth in a microprocessor
- Patent Title (中): 检测微处理器中的保险丝再生长
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Application No.: US12719322Application Date: 2010-03-08
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Publication No.: US08281223B2Publication Date: 2012-10-02
- Inventor: Darius D. Gaskins , Stephan Gaskins
- Applicant: Darius D. Gaskins , Stephan Gaskins
- Applicant Address: TW New Taipei
- Assignee: VIA Technologies, Inc.
- Current Assignee: VIA Technologies, Inc.
- Current Assignee Address: TW New Taipei
- Agent E. Alan Davis; James W. Huffman
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C17/18

Abstract:
A microprocessor includes a first plurality of fuses, a predetermined number of which are selectively blown. Control values are provided from the fuses to circuits of the microprocessor to control operation thereof. A second plurality of fuses are blown with the predetermined number of the first plurality of fuses that are blown and a Boolean complement of the predetermined number. In response to being reset, the microprocessor: reads the predetermined number and the Boolean complement of the predetermined number from the second plurality of fuses, Boolean complements the predetermined number read from the second plurality of fuses to generate a result, compares the result with the Boolean complement of the predetermined number read from the second plurality of fuses, and prevent itself from fetching and executing user program instructions if the result does not equal the Boolean complement of the predetermined number read from the second plurality of fuses.
Public/Granted literature
- US20110035623A1 DETECTION OF FUSE RE-GROWTH IN A MICROPROCESSOR Public/Granted day:2011-02-10
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