Invention Grant
US08283117B2 Disease diagnosis method, marker screening method and marker using TOF-SIMS
有权
疾病诊断方法,标记筛选方法和使用TOF-SIMS的标记
- Patent Title: Disease diagnosis method, marker screening method and marker using TOF-SIMS
- Patent Title (中): 疾病诊断方法,标记筛选方法和使用TOF-SIMS的标记
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Application No.: US12994263Application Date: 2008-06-25
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Publication No.: US08283117B2Publication Date: 2012-10-09
- Inventor: Tae Geol Lee , Dae Won Moon , Byong Chul Yoo , In Hoo Kim
- Applicant: Tae Geol Lee , Dae Won Moon , Byong Chul Yoo , In Hoo Kim
- Applicant Address: KR Daejeon
- Assignee: Korea Research Institute of Standards and Science
- Current Assignee: Korea Research Institute of Standards and Science
- Current Assignee Address: KR Daejeon
- Agency: The Webb Law Firm
- Priority: KR10-2008-0048552 20080526
- International Application: PCT/KR2008/003620 WO 20080625
- International Announcement: WO2009/145382 WO 20091203
- Main IPC: A61K38/21
- IPC: A61K38/21

Abstract:
The present invention relates to a disease diagnosis method, a marker screening method, and a marker using a time-of-flight secondary ion mass spectrometry (TOF-SIMS), and more particularly, to a large intestine cancer diagnosis method, a large intestine cancer marker screening method, and a large intestine cancer marker using a time-of-flight secondary ion mass spectrometry (TOF-SIMS). Specifically, the present invention provides a method diagnosing a disease using a pattern of secondary ion mass (m/z) peaks of biological samples measured using a time-of- flight secondary ion mass spectrometry (TOF-SIMS) as a marker, a marker screening method being a reference judging an existence or non-existence of a disease, and a marker configured of specific secondary ion mass peaks.
Public/Granted literature
- US20110095179A1 Disease Diagnosis Method, Marker Screening Method and Marker Using TOF-SIMS Public/Granted day:2011-04-28
Information query
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