发明授权
- 专利标题: Method for manufacturing SOI substrate
- 专利标题(中): 制造SOI衬底的方法
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申请号: US13011136申请日: 2011-01-21
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公开(公告)号: US08288249B2公开(公告)日: 2012-10-16
- 发明人: Junichi Koezuka , Hideto Ohnuma
- 申请人: Junichi Koezuka , Hideto Ohnuma
- 申请人地址: JP Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Kanagawa-ken
- 代理机构: Nixon Peabody LLP
- 代理商 Jeffrey L. Costellia
- 优先权: JP2010-014862 20100126
- 主分类号: H01L21/30
- IPC分类号: H01L21/30 ; H01L21/46
摘要:
Manufacturing cost of an SOI substrate is reduced. Yield of an SOI substrate is improved. A method for manufacturing an SOI substrate includes the steps of irradiating a single crystal semiconductor substrate with ions to form an embrittled region in the single crystal semiconductor substrate, bonding the single crystal semiconductor substrate to a base substrate with an insulating film therebetween, and separating the single crystal semiconductor substrate and the base substrate at the embrittled region to form a semiconductor layer over the base substrate with the insulating film therebetween. In the step of forming the embrittled region, ion species which are not mass-separated are used as the ions and a temperature of the single crystal semiconductor substrate is set to 250° C. or higher at the time of irradiation with the ions.
公开/授权文献
- US20110183494A1 METHOD FOR MANUFACTURING SOI SUBSTRATE 公开/授权日:2011-07-28
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