发明授权
US08291394B2 Method and apparatus for detecting transient faults via dynamic binary translation
有权
通过动态二进制翻译检测瞬态故障的方法和装置
- 专利标题： Method and apparatus for detecting transient faults via dynamic binary translation
- 专利标题（中）： 通过动态二进制翻译检测瞬态故障的方法和装置
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申请号： US13135712申请日： 2011-07-13
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公开(公告)号： US08291394B2公开(公告)日： 2012-10-16
- 发明人: George A. Reis , Robert Cohn , Shubhendu S. Mukherjee
- 申请人： George A. Reis , Robert Cohn , Shubhendu S. Mukherjee
- 申请人地址： US CA Santa Clara
- 专利权人： Intel Corporation
- 当前专利权人： Intel Corporation
- 当前专利权人地址： US CA Santa Clara
- 代理商 L. Cho
- 主分类号： G06F9/45
- IPC分类号： G06F9/45
摘要：
A method for detecting transient fault includes translating binary code to an intermediate language code. An instruction of interest in the intermediate language code is identified. Reliability instructions are inserted in the intermediate language code to validate values from the instruction of interest. The intermediate language code is translated to binary code. Other embodiments are described and claimed.
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